Dynamic Voltage Scaling Aware Delay Fault Testing

The application of Dynamic Voltage Scaling (DVS)
to reduce energy consumption may have a detrimental
impact on the quality of manufacturing tests employed
to detect permanent faults. This paper analyses the
influence of different voltage/frequency settings on
fault detection within a DVS application. In particular,
the effect of supply voltage on different types of delay
faults is considered. This paper presents a study of
these problems with simulation results. We have
demonstrated that the test application time increases
as we reduce the test voltage. We have also shown that
for newer technologies we do not have to go to very
low voltage levels for delay fault testing. We conclude
that it is necessary to test at more than one operating
voltage and that the lowest operating voltage does not
necessarily give the best fault cover.