Scholarly PublicationMalik , Aamir Saeed and Tae, Sun Choi (2009) Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images. In: 2009 International Conference on Computer and Electrical Engineering, 28-30 December, 2009, Dubai, UAE.
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Abstract
Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of
various well established focus measures with varying texture
reflectance and source illumination. Five focus measures are
selected from the literature. Three different microscopic
objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, Shape From Focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Impact Factor: | IEEE Indexed, Scopus Indexed |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Departments / MOR / COE: | Research Institutes > Institute for Health Analytics Centre of Excellence > Center for Intelligent Signal and Imaging Research Departments > Electrical & Electronic Engineering |
| Depositing User: | Dr Aamir Saeed Malik |
| Date Deposited: | 14 Mar 2011 03:05 |
| Last Modified: | 19 Jan 2017 08:25 |
| URI: | http://scholars.utp.edu.my/id/eprint/4519 |
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