Tabe, Michiharu and Nuryadi, Ratno and Moraru, Daniel and Burhanudin, Zainal Arif and Yokoi, K and Ikeda, Hiroya (2008) Si Multidot FETs for Single-Electron Transfer and Single-Photon Detection. Acta Physica Polonica, 113 (3). pp. 811-814.
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Official URL: http://przyrbwn.icm.edu.pl/APP/SPIS/a113-3.html
Abstract
Recently, there have been increasing demands for controlling individual electrons, photons, and dopants in developing nm scale Si devices. Our most recent results on Si single-electron nano-devices will be presented. We have
demonstrated single-electron transfer in random-tunnel-junctions by a cycle of ac gate bias, detection of photons and detection of individual acceptor ions by Si single-hole transistor.
Item Type: | Article |
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
Depositing User: | Dr Zainal Arif Burhanudin |
Date Deposited: | 16 Mar 2011 04:17 |
Last Modified: | 19 Jan 2017 08:26 |
URI: | http://scholars.utp.edu.my/id/eprint/4501 |