Methodology of statistical RTS noise analysis with charge-carrier trapping models

Tang, Tong Boon and Murray, Alan F and Roy, Scott (2010) Methodology of statistical RTS noise analysis with charge-carrier trapping models. IEEE Transactions on Circuits and Systems I: Regular Papers, 57 (5). pp. 1062-1070.

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Item Type:	Article
Depositing User:	Prof. Dr. Tang Tong Boon
Date Deposited:	19 Jun 2023 04:19
Last Modified:	19 Jun 2023 04:19
URI:	http://scholars.utp.edu.my/id/eprint/36597

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