Simulation study of single event burnout hardening technique on power UMOSFET using P-Island layer

Krishnamurthy, S. and Kannan, R. and Azmadi Hussin, F. (2020) Simulation study of single event burnout hardening technique on power UMOSFET using P-Island layer. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Impact Factor:	cited By 0
Depositing User:	Ms Sharifah Fahimah Saiyed Yeop
Date Deposited:	27 Aug 2021 05:05
Last Modified:	27 Aug 2021 05:05
URI:	http://scholars.utp.edu.my/id/eprint/24486

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