Scholarly PublicationItems where Author is "Zain Ali, N.B."
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Shoaib, M. and Hamid, N.H. and Tariq Jan, M. and Zain Ali, N.B. (2017) Effects of Crack Faults on the Dynamics of Piezoelectric Cantilever-Based MEMS Sensor. IEEE Sensors Journal, 17 (19). pp. 6279-6294.
Shoaib, M. and Hamid, N.H. and Malik, A.F. and Zain Ali, N.B. and Tariq Jan, M. (2016) A Review on Key Issues and Challenges in Devices Level MEMS Testing. Journal of Sensors, 2016.
Socheatra, S. and Zain Ali, N.B. and Khir, M.H.Md. (2014) Printed circuit board interconnect fault inspection based on eddy current testing. In: UNSPECIFIED.