Items where Author is "Mohammadat, M.T."

Mohammadat, M.T. and Ali, N.B.Z. and Hussin, F.A. and Zwolinski, M. (2015) Resistive open faults detectability analysis and implications for testing low power nanometric ICs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 23 (3). pp. 580-583.