A framework to study time-dependent variability in circuits at sub-35nm technology nodes

Tang, Tong Boon and Murray, Alan F and Cheng, Binjie and Asenov, Asen (2012) A framework to study time-dependent variability in circuits at sub-35nm technology nodes. In: 2012 IEEE International Symposium on Circuits and Systems (ISCAS).

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Depositing User:	Prof. Dr. Tang Tong Boon
Date Deposited:	19 Jun 2023 04:18
Last Modified:	19 Jun 2023 04:18
URI:	http://scholars.utp.edu.my/id/eprint/36589

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