Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

Kou, Lili and Ma, Zongmin and Li, Yan Jun and Naitoh, Yoshitaka and Komiyama, Masaharu and Sugawara, Yasuhiro (2015) Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback. Nanotechnology, 26 (19). p. 195701.

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Item Type:	Article
Depositing User:	PROF MASAHARU KOMIYAMA
Date Deposited:	06 Apr 2023 03:57
Last Modified:	06 Apr 2023 03:57
URI:	http://scholars.utp.edu.my/id/eprint/35493

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